KUALA LUMPUR, Oct 31 -- The new OmniScan X3 flaw detector is raising the portable phased array ultrasonic testing standard with innovations, improving entire inspection workflow.
The comprehensive onboard scan plan tool enables users to visualise the inspection, helping reduce the risk of errors.
Setting up for a job is faster and more efficient while total focusing method images collected via full matrix capture give users more confidence in their decision-making.
The setup is faster with improved calibration tools and support for simultaneous probe and beam set configuration, onboard dual linear, matrix and dual matrix array creation and automatic wedge verification.
Certified IP65 dust proof and water resistant, the instrument has the reliability and ease of use that OmniScan flaw detectors are known for, combined with high-quality images that help make interpreting flaws more obvious.
The OmniScan X3 flaw detector makes analysis and reporting faster, both onboard the instrument and on a PC.
More information about the OmniScan flaw detectors, visit www.olympus-ims.com
-- BERNAMA
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